ad3e6e5d5a
1. Disable BatteryType section which is device-specific 2. Make timeout longer since meminfo section timedout in test 3. make some negative values sint 4. varint can be 64 bits, there is a bug implicitly convert it to 32 which loses values. 5. Found another bug which failed to read 64 bits varint, create a native test to make sure it works. Bug: 77291057 Test: atest CtsIncidentHostTestCases:com.android.server.cts.IncidentdTest Change-Id: I04cc730741f7901f37ac57a11af7777d57118a23
27 lines
1.2 KiB
XML
27 lines
1.2 KiB
XML
<?xml version="1.0" encoding="utf-8"?>
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<!-- Copyright (C) 2018 The Android Open Source Project
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Licensed under the Apache License, Version 2.0 (the "License");
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you may not use this file except in compliance with the License.
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You may obtain a copy of the License at
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http://www.apache.org/licenses/LICENSE-2.0
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Unless required by applicable law or agreed to in writing, software
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distributed under the License is distributed on an "AS IS" BASIS,
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WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
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See the License for the specific language governing permissions and
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limitations under the License.
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-->
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<configuration description="Config for libprotoutil_test">
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<target_preparer class="com.android.tradefed.targetprep.PushFilePreparer">
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<option name="cleanup" value="true" />
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<option name="push" value="libprotoutil_test->/data/nativetest/libprotoutil_test" />
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</target_preparer>
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<option name="test-suite-tag" value="apct" />
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<test class="com.android.tradefed.testtype.GTest" >
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<option name="native-test-device-path" value="/data/nativetest" />
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<option name="module-name" value="libprotoutil_test" />
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</test>
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</configuration>
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